Plenary Speakers:
Way Kuo, City University of Hong Kong
Way Kuo is the President of City University of Hong Kong. He is a member of the US National Academy of Engineering and Academia Sinica in Taiwan, A Foreign Member of the Chinese Academy of Engineering, and a Foreign Member of the Russian Academy of Engineering. A pioneer in reliability research of systems in their infant stage, He is renowned for his work in designing the reliability of electronics systems and nuclear energy, and has made breakthroughs in nano-reliability research.

Title: Data-driven Crisis Management
Andrew K.S. Jardine, Professor Emeritus, University of Toronto
Andrew K.S. Jardine is the Founding Director of the Centre for Maintenance Optimization and Reliability Engineering (C-MORE) at the University of Toronto. He is the author of Maintenance, Replacement and Reliability, co-editor of Maintenance Excellence: Optimizing Equipment Life Cycle Decisions and co-author of Maintenance, Replacement & Reliability: Theory and Applications. Dr. Jardine is Professor Emeritus in the Department of Mechanical and Industrial Engineering, University of Toronto, Canada

An Analytic Tool Box for Optimizing CBM Decisions
William Q. Meeker, Iowa State University
William Q. Meeker is Professor of Statistics and Distinguished Professor of Liberal Arts and Sciences at Iowa State University. He has more than 40 years of experience working in the application of statistical methods to engineering applications including reliability and nondestructive evaluation. He has done research and consulted extensively on problems in reliability data analysis, warranty analysis, experimental design, accelerated testing, nondestructive evaluation, and statistical computing. His practical experience includes numerous long-term visits to AT&T Bell Laboratories, General Electric Global Research, and Los Alamos National Laboratory. He is a Fellow of the American Statistical Association (ASA), the American Society for Quality (ASQ), and the American Association for the Advancement of Science, and a past Editor of Technometrics. He is co-author of the books Statistical Methods for Reliability Data with Luis Escobar (1998), the second edition of Statistical Intervals with Luis Escobar and Gerald Hahn (2017), 14 book chapters, and many publications in the engineering and statistical literature. He has won numerous awards for his research and contributions to the statistical and engineering professions including the ASQ Shewhart Medal and ASA’s Deming Lecture Award.

Reliability in the 21st Century
Jing Jiang, University of Western Ontario
Jing Jiang received a Ph.D. degree from the University of New Brunswick in 1989. He has been with the Department of Electrical and Computer Engineering, University of Western Ontario, London, ON, Canada since 1991, where he is currently an NSERC/UNENE Senior Industrial Research Chair Professor. His current research interests include fault-tolerant control of safety-critical systems, advanced control of power plants containing non-traditional energy resources, and instrumentation and control for nuclear power plants. He is a registered professional engineer (P. Eng.) in Ontario and a fellow of the Canadian Academy of Engineering.

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